Two-Channel Confocal Controllers for Precision Measurement

Micro-Epsilon has expanded its confocal chromatic measurement portfolio with the IFC2412 and IFC2417 two-channel controllers and updated IFD2410 and IFD2415 sensor systems featuring Ethernet data output. The additions target high-precision thickness and distance measurement in semiconductor manufacturing, battery cell production, and optical inspection in machine building.

Two-Channel Controllers for Thickness and Layer Analysis
The new IFC2412 and IFC2417 controllers are two-channel versions of the established IFC2411 and IFC2416 models. Integrated calculation functions enable two-sided thickness measurements using a single controller, reducing hardware requirements in inline production systems. This configuration is particularly relevant for applications such as wafer inspection, coating thickness monitoring, glass measurement, and separator film inspection in battery cell manufacturing.

The IFC2412 operates at an adjustable measuring rate of up to 8 kHz and achieves resolution down to 2 nm. The IFC2417 increases the measuring rate to 25 kHz and supports multi-peak measurements for up to five layers, enabling detection and evaluation of multilayer materials such as transparent coatings or laminated structures.

Both controllers use active exposure control of the CCD array to stabilize measurements on reflective or optically challenging surfaces. The devices are housed in IP40-rated aluminum enclosures and designed for DIN rail mounting in control cabinets, supporting integration into OEM platforms and serial production environments.

Ethernet-Enabled All-in-One Sensor Systems
Micro-Epsilon has also extended the IFD2410 and IFD2415 confocal sensor systems with integrated Ethernet connectivity. These compact all-in-one systems combine controller and sensor in a single unit and do not require fiber optics, simplifying installation in space-constrained machinery.

The Ethernet interface enables direct transmission of measured values with 32-bit resolution, supporting high-precision digital signal processing within automated production systems. In addition to Ethernet, the systems support common industrial communication protocols including EtherCAT, PROFINET, and EtherNet/IP, facilitating integration into existing industrial automation infrastructures.

The availability of the MEDAQLib software and driver library allows users to integrate the sensors into proprietary software environments. This supports parameter configuration, data acquisition, and synchronization with higher-level machine control systems.

Application Context in Industrial Metrology
Confocal chromatic measurement is widely used for non-contact distance and thickness measurement of transparent, reflective, and multilayer materials. Compared with tactile methods, it enables high-speed inline inspection without mechanical influence on the measured object. High sampling rates—up to 25 kHz in the IFC2417—support dynamic processes such as roll-to-roll coating or semiconductor wafer handling.

By combining nanometer-level resolution, multi-layer capability, and standardized industrial interfaces, the expanded portfolio addresses the need for scalable, high-precision optical metrology within automated production lines and digital quality assurance systems.