Boecker News

TWIN ELEVATORS ASSIST WITH DOM TOWER RESTAURATION

The dom tower in Utrecht is the highest church tower in the Netherlands. The 700-year-old landmark rises 112 meters above the city. At this height, the tower is exposed to severe weather conditions that have led to erosion of the structure over the centuries.

Yamaha Motor News

Yamaha to present latest robots for advanced automation at Motek 2022

Yamaha Motor Robotics FA Section will show visitors to Motek 2022 its family of compact, affordable industrial robots boost the productivity of common component-handling and product-assembly processes.

Intel News

Intel Releases Open Source AI Reference Kits

Intel has released the first set of open source AI reference kits specifically designed to make AI more accessible to organizations in on-prem, cloud and edge environments. Open source designs simplify AI development for solutions across healthcare, manufacturing, retail and other industries.

Dürr Systems AG News

NEW SOFTWARE FOR IMPROVED QUALITY MANAGEMENT AND GREATER OVERALL EQUIPMENT EFFECTIVENESS

Higher first-run rate, less rework, systematic fault analysis: DXQplant.analytics helps paint shop operators improve production quality and effectiveness. The latest software tool from Dürr’s DXQanalyze product family detects systematic fault patterns and their causes early, making it much easier to find the relevant fault source.

Gefran News

Advanced communication at field level: Gefran presents the new KS-I industrial pressure probe with IO-Link interface

Gefran – the Italian multinational group specialised in the design and production of sensors, industrial process control systems, electric drives and automation components – is expanding its range of solutions dedicated to Industry 4.0 by presenting the new KS-I industrial pressure transmitter, equipped with IO-Link 1.1 digital output and advanced diagnostic functions.

Rohde & Schwarz

Rohde & Schwarz announces on-wafer device characterization test solution

Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.

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